H+P SPECTROSCOPY

Characteristics

• flat-field grazing-incidence spectrograph

• proprietary H+P design for direct source imaging and maximum light collection

• wavelength range from 1 to 200 nm

• SXR 1-20nm / XUV 5-80nm / VUV 40-200nm

• other wavelength ranges on request

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• operating pressure <10^-6 mbar

• modular, adaptable design

• turn-key, hassle-free operation

Special solutions

We offer specialized solutions for almost every application, including:

• non-magnetic instruments

• special housing geometries, in-chamber solutions

• EMP-protection

• special mounting situations (e.g. upside-down)

• UHV configurations

Please contact us with any special requirements you may have.

Customization

Our goal is to supply the perfect XUV  spectrometer for your application. We customize every spectrometer to exactly match the desired application.

This includes e.g.:

• interfacing to experimental chambers

• adaption of the source distance

• integration of customer-supplied detectors

• user-defined filter mounts

Applications

• high harmonic generation (HHG) radiation

• high intensity laser-matter interaction

• undulator and free-electron-laser (FEL) radiation

• magnetically confined plasmas

• fusion research

• characterization of line-emission sources

• EUV source calibration
   

Detection

Our spectrometers can be operated with all state-of-the-art detection systems:

• x-ray CCD cameras for highest resolution, large dynamic range and absolute signal strength

• large-area MCPs for broadest wavelength coverage and gated / intensified detection

We will select and supply the detector that best fits your application

Specifications

For further specifications, please download the product spec sheet:

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Please send us an email inquiry for further information, references or a quotation.

Configurations