nanoLIGHT
SPECTROMETER & BEAM PROFILER
XUV beam characterization made easy: the nanoLIGHT combines the functionalities of an XUV spectrometer and an XUV beam profiler in one unit.
Quick integration: the entire device is mounted on a standard CF200 vacuum flange. Switching between operating modes or removal from the XUV beam path is completed within seconds.
Characteristics
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In-situ XUV spectrometer and beam profiler
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Cost-effective
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Compact footprint (16x17cm²)
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Quick mode switching
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Wavelength coverage 10 - 80nm, recorded simultaneously
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Insert for thin metal spectral filters
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Background light reduction jig
Specifications
For further specifications, please download the product spec sheet:
Please send us an email inquiry for further information, references or a quotation.
Detection
A large area MCP combined with a phosphorous screen detects the spectrum. This has the following benefits:
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broad spectral coverage
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high efficiency
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large dynamic range
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adjustable sensitivity, up to single photon counting
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low background noise
Applications
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high harmonic generation (HHG) radiation
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high intensity laser-matter interaction
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undulator and free-electron-laser (FEL) radiation
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magnetically confined plasmas
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fusion research
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characterization of line-emission sources
Configurations
