Characteristics

• In-situ XUV spectrometer and beam profiler

• Cost-effective

• Compact footprint (16x17cm²)

• Quick mode switching

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• Wavelength coverage 10 - 80nm, recorded simultaneously

• Insert for thin metal spectral filters

• Background light reduction jig

Specifications

For further specifications, please download the product spec sheet:

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Please send us an email inquiry for further information, references or a quotation.

Detection

A large area MCP combined with a phosphorous screen detects the spectrum. This has the following benefits:

• broad spectral coverage

• high efficiency

• large dynamic range

• adjustable sensitivity, up to single photon counting

• low background noise

Applications

• high harmonic generation (HHG) radiation

• high intensity laser-matter interaction

• undulator and free-electron-laser (FEL) radiation

• magnetically confined plasmas

• fusion research

• characterization of line-emission sources

Configurations